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Electron microprobe analysis and scanning electron microscopy in geology
Autor: Reed, S. J. B.
Rok: 1996.
ISBN: 9780521482806
ISBN: 9780521483506
OKCZID: 110085985
Vydání: 1st pub.
Citace (dle ČSN ISO 690):
REED, S.J.B. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge: Cambridge University Press, 1996. XII+201 s.
Hodnocení:
4.0 / 5
(6 hlasů)
Anotace
This book describes the important techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) as used in many branches of geology, including mineralogy, petrology, paleontology and sedimentology. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray "maps" showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both "true" electron microprobes and SEM's fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible to novices, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.