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X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics)
Rok: 1999
ISBN: 9783540651826
OKCZID: 110729135
Citace (dle ČSN ISO 690):
TOLAN, Metin. X-ray scattering from soft-matter thin films: materials science and basic research. Berlin: Springer, c1999. viii, 197 s. Springer tracts in modern physics, Vol. 148.
Anotace
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.